• <ul id="4xqgd"><legend id="4xqgd"></legend></ul>
    <thead id="4xqgd"></thead>
    <strike id="4xqgd"></strike>
    <ul id="4xqgd"></ul>
    1. <form id="4xqgd"></form>
          <code id="4xqgd"></code>
          Third generation

          Semiconductor Testing

          family

          Third generation semiconductor testing family
          Home Product Handler Handler
          MENU
          KGD handler



          Suspended power supply

          Multiple sites in parallel

          Multi-channel high precision

          Supports multiple extensions

          Model KGD handler
          Product introduction Fully automatic testing, supporting SiC wafer, Waffle Pack, Tape&Reel loading and unloading.
          Features ? Multi-station parallel testing, different stations support different temperatures and test items.
          ? Static, dynamic, avalanche function testing, and the test sequence is adjustable.
          ? High temperature preheating and chip surface anti-oxidation protection.
          ? High temperature test, temperature range: room temperature~200°C.
          ? The power-on pin card is sealed and supports nitrogen filling to protect against high-pressure sparks and nitrogen pressure monitoring.




          毛片一区二区三区蜜臀av,色偷拍自怕亚洲综合,午夜看片无码国产,视频区中文字幕无码
        1. <ul id="4xqgd"><legend id="4xqgd"></legend></ul>
          <thead id="4xqgd"></thead>
          <strike id="4xqgd"></strike>
          <ul id="4xqgd"></ul>
          1. <form id="4xqgd"></form>
                <code id="4xqgd"></code>