Third generation
Semiconductor Testing
family
Third generation semiconductor testing family
MENU
QT-8409PIM high-power dynamic and static comprehensive test system
QT-8409PIM power module dynamic and static test system Applied to IGBT/SIC power module DC/AC dynamic and static parameter test, support high temperature/normal temperature, mass production/manual test, automatic/semi-automatic application scenarios
|
High-speed short-circuit protection |
Low stray |
Flexible tooling |
Suitable for mass production/manual test |
|
Type |
QT-8409PIM |
| Advantages |
Industry leading short circuit protection speed, effective protection of Socket, low stray solution Quickly change different tooling |
| Main Features |
? Support 4 stations ? ISC 12KA LS<30nH ? AC：SW、 TRR 、ISC、QG、RBSOA test ? AC@3000A 1500V ? DC@2000A 2KV /3KV/6KV/8KV ? Protect Clamp<2us ? Test object：PIM IGBT module, SiC module, DBC, three level products, etc |
|
No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
|
+86 757 83207313 (Sales) |
|
+86 757 83208786 (Sales) |
|
info@powertechsemi.com |
Copyright PowerTECH industrial Co., Ltd. Powertechsmemi.com ? 2015 | Privacy policy | Sitmap 粵ICP備17127080號(hào)-1
