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          Prober
          
                             
          Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading.
Fully automatic CCD visual n
          
                             
           


          

          

          
	
		
          
			
				
          
					 
				
          
				
          
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				Model 
			
			
				Prober
			
		
          
		
          
			
				Product introduction 
			
			
				Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading. 
          
			          		
		
          
		
          
			
				Features 
			
			
				? Fully automatic CCD visual needle positioning. 
          
         ? High-precision positioning platform. 
          
         ? Support normal high temperature testing. 
          
         ? Generate Mapping display Bin in real time. 
          
         ? Universal GPIB, TTL, R-232 interface. 
          
			          		
		
          
	          

          

          
                           

          

          

   
    
               
  
                
                
    
          
    
    
    
    
    
    
     
     
      

          

              
                 
          
            
          
            
    
          
    
    
    

            

  

  

          
            
          
            
          
            
          

          

   

          
  
    

  
 











          
    
    

          


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