Third generation
Semiconductor Testing
family
Third generation semiconductor testing family
MENU
QT-8600RF Mixed Signal RF Test System
RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test
|
Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
| Model | QT-8600RF Mixed Signal RF Test System |
| Product Advantages | RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test |
| Key Features |
? DC, digital, RF integrated machine ? 16 RF ports (8 in & 8 out) ? 6Ghz RF measurement circuit, power can be configured to 48dBm ? Self-developed RF source board and algorithm, UPH improves by more than 90% compared with traditional ones ? Supports vector and scalar testing ? Digital meets MIPI 50Mhz or above test ? Supports 2-station RF parallel testing and multi-station composite testing ? Provide a cost-effective test platform for RF switches, LNA, TUNER, filters and other devices. |
|
No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
|
+86 757 83207313 (Sales) |
|
+86 757 83208786 (Sales) |
|
info@powertechsemi.com |
Copyright PowerTECH industrial Co., Ltd. Powertechsmemi.com ? 2015 | Privacy policy | Sitmap 粵ICP備17127080號-1
