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          Third generation

          Semiconductor Testing

          family

          Third generation semiconductor testing family
          Home Product Test System Power Device Testing System
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          KGD (Know Good Die) testing solution

          Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG; Support testing pin card protection scheme; Provide a complete set of testing + sorting solutions;



          Pin card 

          protection

            

          Two-DUT test in parallel

          High temperature and 

          normal temperature

          Data merge

          Model KGD testing solutions
          Product Advantages ? Low spurious solutions;
          ? Exclusive pin card protection patented technology;
          ? Overload and undervoltage protection;
          ? Test two wafers at a time;
          ? Supports high temperature heating






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