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          第三代
          半導(dǎo)體測試家族
          Third generation semiconductor testing family
           
        
        
    
           
           
     
    
            
    
           
          
        
            
        
           
             
        
                         
               
        
                
                
                
        
          
    
          
      
     
    
    
           
            
            
          
                  
          
                       
                       
            
                          
                                             
                       
     
                          
                          
                       
          
           
                 
          
                 
          
           
                
                   

          
    
          
             
                     
                        
          
                            
          
                                
          
                                    
          
                                    
                                                        
                                                    
                      
                                 
                
                
                
                
                                        
                                                   
                                    
          
                                    
          
                                    
          
                                    
          
                                
          
                            
          
                            
          
                                                        
                            
                            
                            
           
                        
          
             
          
             
          
                    
          
                             
          Gravity double track sorting machine
          
                             
          
                             
           


          

          

          
	
		
          
			
				
          
					 
				
          
				
          
					Suspended power supply
				
          
			          		
			
				
          
					 
				
          
				
          
					Multiple sites in parallel
				
          
			          		
			
				
          
					 
				
          
				
          
					Multi-channel high precision
				
          
			          		
			
				
          
					 
				
          
				
          
					Supports multiple extensions
				
          
			          		
		
          
	          

          
                             
          
                             
          
                                                          
          
                    
          
             
          
    
            
    
          
    

          
	
		
          
			
				Model 
			
			
				Gravity double track sorting machine
			
		
          
		
          
			
				Product introduction 
			
			
				Applicable to TO-247, TO-220, TO-263, Tpak and other packages. 
          
			          		
		
          
		
          
			
				Features 
			
			
				? Parallel testing of dual rails at normal and high temperatures, 80% higher efficiency than single rail. 
          
      ?Dynamic test Docking structure spur is less than 30uH. 
          
      ? Provides an adjustable high temperature test environment of 30°C~200°C. 
          
			          		
		
          
	          

          

          
                           
          

   
    
               
  
                
                
    
          
    
    
    
    
    
    
          
        
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