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          第三代
          半導(dǎo)體測試家族
          Third generation semiconductor testing family
           
        
        
          首頁 產(chǎn)品中心 Test System Power Device Testing System
          分類
          
    
           
           
     
    
            
    
           
          
        
            
        
           
             
        
                         
               
        
                
                
                
        
          
    
          
      
     
    
    
           
            
            
          
                  
          
                       
                       
            
                          
                                             
                       
     
                          
                          
                       
          
           
                 
          
                 
          
           
                
                   

          
    
          
             
                     
                        
          
                            
          
                                
          
                                    
          
                                    
                                                        
                                                    
                      
                                 
                
                
                
                
                                        
                                                   
                                    
          
                                    
          
                                    
          
                                    
          
                                
          
                            
          
                            
          
                                                        
                            
                            
                            
           
                        
          
             
          
             
          
                    
          
                             
          KGD (Know Good Die) testing solution
          
                             
          Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG;
Support testing pin card protection scheme;
Provide a complete set of testing + sorting solutions;
          
                             
           


          

          

          
	
		
          
			
				
          
					  
				
          
				
          
					Pin card 
				
          
				
          
					protection
          
                
				
          
			          		
			
				
          
					    
				
          
				
          
					Two-DUT test in parallel
          
                
				
          
			          		
			
				
          
					  
				
          
				
          
					High temperature and  
				
          
				
          
					normal temperature 
				
          
			          		
			
				
          
					  
				
          
				
          
					Data merge 
				
          
			          		
		
          
	          

          
                             
          
                             
          
                                                          
          
                    
          
             
          
    
            
    
          
    

          
	
		
          
			
				Model 
			
			
				KGD testing solutions
			
		
          
		
          
			
				Product Advantages 
			
			
				? Low spurious solutions;
          
                                                 ? Exclusive pin card protection patented technology;
          
                                                 ? Overload and undervoltage protection;
          
                                                 ? Test two wafers at a time;
          
                                                 ? Supports high temperature heating
          
			          		
		
          
		
          
			
				
          
			          		
			
				
          
			          		
		
          
	          

          

          
                                                                            
          

   
    
               
  
                
                
    
          
    
    
    
    
    
    
          
        
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