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          第三代
          半導體測試家族
          Third generation semiconductor testing family
          分類
           
          QT-8600RF Mixed Signal RF Test System

          RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test



          Suspended power supply

          Multiple sites in parallel

          Multi-channel high precision

          Supports multiple extensions

          Model QT-8600RF Mixed Signal RF Test System
          Product Advantages RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test
          Key Features ? DC, digital, RF integrated machine
          ? 16 RF ports (8 in & 8 out)
          ? 6Ghz RF measurement circuit, power can be configured to 48dBm
          ? Self-developed RF source board and algorithm, UPH improves by more than 90% compared with traditional ones
          ? Supports vector and scalar testing
          ? Digital meets MIPI 50Mhz or above test
          ? Supports 2-station RF parallel testing and multi-station composite testing
          ? Provide a cost-effective test platform for RF switches, LNA, TUNER, filters and other devices.




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